atomic force microscopy thesis

30.05.2007 -
Atomic Force Microscopy for Better Probing. Surface Properties at Nanoscale: Calibration,. Design and Application. Yu Liu. The University of Western Ontario. Supervisor. Jun Yang. The University of Western Ontario. Graduate Program in Mechanical and Materials Engineering. A thesis submitted in partial fulfillment of the
Ph.D. Thesis. Atomic force microscopy investigation of morphology and nanomechanical properties of Aß-amyloid fibrils. Árpád Karsai M.D.. Program: Biochemistry and molecular biology. Program leader: Dr. Balázs Sümegi. Subprogram B-130: Investigation of functional protein dynamics with biophysical methods.
Scanning Probe Microscopy Studies of a Metal Oxide Surface. PhD Thesis 2007. Scanning Probe Microscopy imaging of single crystal surfaces and nanoscale systems has demonstrated great potential for new advances in science. With the invention and recent development of the Atomic Force Microscope used in the
The Study of Contact, Adhesion and Friction at the Atomic Scale by Atomic Force Microscopy by. Robert William Carpick. B.Sc. (University of Toronto) 1991. M.A. (University of California, Berkeley) 1993. A dissertation submitted in partial satisfaction of the requirements for the degree of. Doctor of Philosophy in. Physics in the.
simultaneously electric (conductivity and surface potential) and dielectric. (dielectric constant) properties, surface morphology, and mechanical properties of thin films of conjugated polymers and their blends. In this thesis, I first present a combined topography, Kelvin probe force microscopy (KPFM), and scanning conductive
Atomic force microscopy study on the mechanics of influenza viruses and liposomes. Rasterkraftmikroskop Studie der Mechanik von Influenza-Viren und Liposomen. Li, Sai. Doctoral thesis. Date of Examination: 2012-11-20. Date of issue: 2012-11-28. Advisor: Schaap, Iwan Dr. Referee: Janshoff, Andreas Prof. Dr. Referee:
Item Type: Ph.D. Thesis. Title: The Application of Atomic Force Microscopy in Semiconductor Technology - Towards High-K Gate Dielectric Integration. Language: English. Abstract: Development of semiconductor technology over the last five decades has led to aggressive scaling down of integrated circuit (IC) device
ATOMIC FORCE MICROSCOPY METHOD. DEVELOPMENT FOR SURFACE ENERGY. ANALYSIS. Clare Aubrey Medendorp. University of Kentucky, Click here to let us know how access to this document benefits you. This Dissertation is brought to you for free and open access by the Graduate
Atomic Force Microscopy and Force Spectroscopy of. Biomembranes and Applications to Nanotechnology. Kislon Vo¨ıtchovsky. Condensed Matter Physics, Clarendon Laboratory, University of Oxford, Oxford OX1 3PU. DPhil Thesis, Trinity Term 2006. Abstract. Biological membranes form the interface between the cell and

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